Please use this identifier to cite or link to this item: http://ricaxcan.uaz.edu.mx/jspui/handle/20.500.11845/1453
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dc.contributor49390es_ES
dc.contributor31249-
dc.contributor.otherhttps://orcid.org/0000-0002-7337-8974-
dc.contributor.otherhttps://orcid.org/0000-0003-1519-7718-
dc.contributor.otherhttps://orcid.org/0000-0002-8060-6170-
dc.coverage.spatialGlobales_ES
dc.creatorDe la Rosa Miranda, Enrique-
dc.creatorBerriel Valdos, Luis Raúl-
dc.creatorGonzález Ramírez, Efrén-
dc.creatorOlvera Olvera, Carlos Alberto-
dc.creatorSaucedo Anaya, Tonatiuh-
dc.creatorArceo Olague, José Guadalupe-
dc.creatorDe la Rosa Vargas, José Ismael-
dc.date.accessioned2020-03-24T20:19:07Z-
dc.date.available2020-03-24T20:19:07Z-
dc.date.issued2016-12-01-
dc.identifierinfo:eu-repo/semantics/publishedVersiones_ES
dc.identifier.isbn978-90-423-0439-0es_ES
dc.identifier.urihttp://ricaxcan.uaz.edu.mx/jspui/handle/20.500.11845/1453-
dc.identifier.urihttps://doi.org/10.48779/fe5y-n314-
dc.description.abstractSome of the interferometry methods proposed for flame temperature measurements from its projection could be complex and demand so much computing time. Assuming a circular symmetric and smooth flame temperature distribution, it is possible to use a linear combination of Gaussian functions with weights constrained to non-negative values.es_ES
dc.language.isoenges_ES
dc.publisherShaker Publishinges_ES
dc.relation.urigeneralPublices_ES
dc.rightsAtribución 3.0 Estados Unidos de América*
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/us/*
dc.sourceOptical Measurement Techniques for Structures & Systems III,Editor: Joris Dirckx, Capítulo 6, Publisher: Shaker Publishing, pp.51-59es_ES
dc.subject.classificationINGENIERIA Y TECNOLOGIA [7]es_ES
dc.subject.otherInterferometryes_ES
dc.subject.otherflame temperaturees_ES
dc.subject.otherGaussian functionses_ES
dc.titleFast flame temperature estimation using a point diffraction interferometer and non-negative least square methodes_ES
dc.typeinfo:eu-repo/semantics/bookPartes_ES
Appears in Collections:*Documentos Académicos*-- M. en Ciencias de la Ing.

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