Please use this identifier to cite or link to this item: http://ricaxcan.uaz.edu.mx/jspui/handle/20.500.11845/1795
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dc.contributor31249es_ES
dc.contributor20608-
dc.contributor.otherhttps://orcid.org/0000-0002-7337-8974-
dc.contributor.otherhttps://orcid.org/0000-0002-8060-6170-
dc.coverage.spatialGlobales_ES
dc.creatorDe la Rosa Miranda, Enrique-
dc.creatorGonzález Ramírez, Efrén-
dc.creatorBerriel Valdos, Luis Raúl-
dc.creatorSaucedo Anaya, Tonatiuh-
dc.creatorVilla Hernández, José de Jesús-
dc.creatorDe la Rosa Vargas, José Ismael-
dc.creatorEscalante García, Nivia Iracemi-
dc.date.accessioned2020-04-21T01:17:38Z-
dc.date.available2020-04-21T01:17:38Z-
dc.date.issued2013-10-14-
dc.identifierinfo:eu-repo/semantics/publishedVersiones_ES
dc.identifier.isbn978-90-423-0419-2.es_ES
dc.identifier.urihttp://ricaxcan.uaz.edu.mx/jspui/handle/20.500.11845/1795-
dc.identifier.urihttps://doi.org/10.48779/ryjn-zg68-
dc.description.abstractThe determination of scalar magnitude distribution asociated to refractive index such as temperature and pressure are of interest in many areas of engineering and science. This determination using invasive techniques is slow, does not gives a complete distribution and modifies it when introducing a sensor. We propose a reconstruction method based on optical tomography and wavelets that gives a complete distribution in a faster way than invasive methods.es_ES
dc.language.isoenges_ES
dc.publisherShaker Publishinges_ES
dc.relation.urigeneralPublices_ES
dc.rightsAtribución-SinDerivadas 3.0 Estados Unidos de América*
dc.rights.urihttp://creativecommons.org/licenses/by-nd/3.0/us/*
dc.sourceOptical Measurement Techniques for Structures and Systems II, 5th International OPTIMESS 2012, Joris Dirckx and Jan Buytaert editors, p. 111-120es_ES
dc.subject.classificationINGENIERIA Y TECNOLOGIA [7]es_ES
dc.subject.otherImage reconstructiones_ES
dc.subject.otheroptical tomographyes_ES
dc.titleWavelets Applied to Optical Tomographic Reconstructiones_ES
dc.typeinfo:eu-repo/semantics/bookPartes_ES
Appears in Collections:*Documentos Académicos*-- M. en Ciencias del Proc. de la Info.

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